INVESTIGATION OF THE EFFECT OF FILM THICKNESS ON THE OPTICAL PROPERTIES OF AMORPHOUS Se85-XTe15SbX THIN FILMS

Austine Mulama; Julius Mwabora; Andrew Oduor; Cosmas Muiva; Boniface Muthoka

Austine Mulama Department of Physics, University of Nairobi, Department of Physics and Materials Science, Maseno University
Julius Mwabora Department of Physics, University of Nairobi
Andrew Oduor Department of Physics and Materials Science, Maseno University
Cosmas Muiva Department of Physics, Botswana International University of Science and Technology
Boniface Muthoka Department of Physics, University of Nairobi

Keywords: Alloy, Amorphous Chalcogenide, Film Thickness, Optical Property

Abstract

Amorphous thin films of Se_85-xTe₁₅Sb_x (x = 0.0, 0.5, 2.5, and 5.0 at. %) deposited by flash evaporation technique, have been investigated in the wavelength range of 500nm-3000nm. It is found that the effect of increasing antimony content and film thickness on the as-deposited films led to increase in the absorption coefficient. The optical band gap energy decreased with increase in antimony concentration but increased with increase in film thickness.